International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (2007 : Gaithersburg, Md.)
Frontiers of characterization and metrology for nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, Maryland, 27-29 March 2007 / editors, David G. Seiler ... [et al.] ; sponsoring organizations, National Institute of Standards and Technology ... [et al.] ; poster session sponsors, Applied Materials ... [et al.].
Nanoelectronics -- Congresses.
Molecular electronics -- Congresses.
Integrated circuits -- Ultra large scale integration -- Congresses.
Semiconductors -- Characterization -- Congresses.
Seiler, David G.
National Institute of Standards and Technology (U.S.)