International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (2011 : Grenoble, France) Frontiers of characterization and metrology for nanoelectronics, 2011 : Grenoble, France, 23-26 May 2011 / editors, David G. Seiler ... [et al.].

International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (2011 : Grenoble, France)

Frontiers of characterization and metrology for nanoelectronics, 2011 : Grenoble, France, 23-26 May 2011 / editors, David G. Seiler ... [et al.].

Nanoelectronics -- Congresses.

Semiconductors -- Characterization -- Congresses.

Semiconductors -- Measurement -- Congresses.

Seiler, David G.