International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (2009 : Albany, N.Y.)
Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Albany, New York, 11-15 May 2009 / editors, David G. Seiler ... [et al.]
Integrated circuits -- Ultra large scale integration -- Congresses.
Integrated circuits -- Ultra large scale integration -- Congresses -- Software.
Seiler, David G. edt