International Workshop on Stress-Induced Phenomena in Metallization (10th : 2008 : Austin, Texas)
Stress-induced phenomena in metallization : Tenth International Workshop on Stress-Induced Phenomena in Metallization : Austin, Texas, 5-7 November 2008 / editors, Paul S. Ho, Shinichi Ogawa, Ehrenfried Zschech ; sponsoring organization, The University of Texas at Austin.
Interconnects (Integrated circuit technology) -- Defects -- Congresses.
Metal-metal bonds -- Congresses.
Strength of materials -- Congresses.
Nanostructured materials -- Congresses.
Semiconductors -- Congresses.
Copper -- Electric properties -- Congresses.
Ho, P. S.
Ogawa, Shin ichi.
Zschech, Ehrenfried.