International Workshop on Stress-Induced Phenomena in Metallization (9th : 2007 : Kyoto, Japan)
Stress-induced phenomena in metallization : Ninth International Workshop on Stress-Induced Phenomena in Metallization, Kyoto, Japan 4 - 6 April 2007 / editors, Shinichi Ogagawa, Paul S. Ho, Ehrenfried Zschech.
Interconnects (Integrated circuit technology) -- Defects -- Congresses.
Metal-metal bonds -- Congresses.
Strength of materials -- Congresses.
Nanostructured materials -- Congresses.
Semiconductors -- Congresses.
Copper -- Electric properties -- Congresses.
Ogawa, Shin ichi.
Ho, P. S.
Zschech, Ehrenfried.