International Workshop on Stress-Induced Phenomena in Metallization (8th : 2005 : Dresden, Germany)
Stress-induced phenomena in metallization : 8th International Workshop on Stress-Induced Phenomena in Metallization, Dresden, Germany, 12-14 September 2005 / editors, Ehrenfried Zschech... [et al.].
Interconnects (Integrated circuit technology) -- Defects -- Congresses.
Metal-metal bonds -- Congresses.
Strength of materials -- Congresses.
Nanostructured materials -- Congresses.
Semiconductors -- Congresses.
Copper -- Electric properties -- Congresses.
Zschech, Ehrenfried.