International Conference on Characterization and Metrology for ULSI Technology (2005 : Richardson, Tex.)
Characterization and metrology for ULSI technology / editors, David G. Seiler ... [et al.] ; sponsoring organizations, National Institute of Standards and Technology ... [et al.].
Integrated circuits -- Ultra large scale integration -- Congresses.
Integrated circuits -- Ultra large scale integration -- Congresses -- Software.
Seiler, David G.
National Institute of Standards and Technology (U.S.)