International Workshop on Stress-Induced Phenomena in Metallization (7th : 2004 : Austin, Texas)
Stress-induced phenomena in metallization : seventh International Workshop on Stress-Induced Phenomena in Metallization, Austin, Texas 14-16 June 2004 / editors, Paul S. Ho ... [et al.].
Semiconductors -- Defects -- Congresses.
Metallic films -- Congresses.
Thin film devices -- Defects -- Congresses.
Aluminum films -- Congresses.
Metallizing -- Congresses.
Ho, P. S.