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Stress induced phenomena in metallization : sixth international workshop, Ithaca, New York, 25-27 July, 2002 / editors, Shefford P. Baker, Matti A. Korhonen, Eduard Arzt, Paul S. Ho.
Integrated circuits -- Defects -- Congresses.
Thin film devices -- Defects -- Congresses.
Electrodiffusion -- Congresses.
Metallic films -- Congresses.
Electrochemical metallizing -- Congresses.
Aluminum films -- Congresses.
Semiconductors -- Defects -- Congresses.
Liquid crystal devices -- Defects -- Congresses.
Acoustic surface wave devices -- Defects -- Congresses.
Baker, Shefford P.
Korhonen, Matti A.
Arzt, E. (Eduard)
Ho, P. S.
International Workshop on Stress-Induced Phenomena in Metallization (6th : 2001 : Ithaca, New York)
Catalog