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Stress induced phenomena in metallization : fifth international workshop, Stuttgart, Germany, June, 1999 / editors, Oliver Kraft, Eduard Arzt, Cynthia A. Volkert.
Integrated circuits -- Defects -- Congresses.
Thin film devices -- Defects -- Congresses.
Electrodiffusion -- Congresses.
Metallic films -- Congresses.
Electrochemical metallizing -- Congresses.
Aluminum films -- Congresses.
Semiconductors -- Defects -- Congresses.
Liquid crystal devices -- Defects -- Congresses.
Acoustic surface wave devices -- Defects -- Congresses.
International Workshop on Stress-Induced Phenomena in Metallization (5th : 1999 : Stuttgart, Germany)
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