Stress-induced phenomena in metallization : second international workshop, Austin, TX, March 1993 / editors, Paul S. Ho, Che-Yu Li, Paul Totta.
Semiconductors -- Defects -- Congresses.
Metallic films -- Congresses.
Thin film devices -- Defects -- Congresses.
Aluminum films -- Congresses.
Ho, P. S.
Li, Che-Yu.
Totta, Paul.