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Stress-induced phenomena in metallization : first international workshop, Ithaca, NY, 1991 / editors, Che-Yu Li, Paul Totta, Paul Ho.
Semiconductors -- Defects -- Congresses.
Metallic films -- Congresses.
Thin film devices -- Defects -- Congresses.
Aluminum films -- Congresses.
Li, Che-Yu.
Totta, Paul.
Ho, P. S.
Catalog