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Stress induced phenomena in metallization : fourth international workshop, Tokyo, Japan, June, 1997 / editors, Hidekazu Okabayashi, Shoso Shingubara, Paul S. Ho.
Integrated circuits -- Defects -- Congresses.
Thin film devices -- Defects -- Congresses.
Electrodiffusion -- Congresses.
Metallic films -- Congresses.
Electrochemical metallizing -- Congresses.
Aluminum films -- Congresses.
Semiconductors -- Defects -- Congresses.
Liquid crystal devices -- Defects -- Congresses.
Acoustic surface wave devices -- Defects -- Congresses.
Okabayashi, Hidekazu.
Shingubara, Shoso.
Ho, P. S.
International Workshop on Stress-Induced Phenomena in Metallization (4th : 1997 : Tokyo, Japan)
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