International Workshop on Stress-Induced Phenomena in Metallization (11th : 2010 : Bad Schandau, Germany)
Stress-induced phenomena in metallization eleventh International Workshop on Stress-Induced Phenomena in Metallization, Bad Schandau, Germany, 12-14 April 2010 / editors, Ehrenfried Zschech, Paul S. Ho, Shinichi Ogawa.
Interconnects (Integrated circuit technology) -- Defects -- Congresses.
Metal-metal bonds -- Congresses.
Strength of materials -- Congresses.
Nanostructured materials -- Congresses.
Semiconductors -- Congresses.
Copper -- Electric properties -- Congresses.
Zschech, Ehrenfried.
Ho, P. S.
Ogawa, Shin ichi.